Sensors and Devices Characterization

Network Analyzer E8361A PNA (Agilent)

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System for Physical Properties Measurements PPMS
(Quantum Design)

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Superconducting Quantum Interference Magnetometer SQUID
(Quantum Design)

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Pulsed Terrahertz Time-Domain Spectrometer up to 7 THz IRS
2000 Pro (Aispec )

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Thermogravimetric/Differential Thermal Analysis (TG/DTA)
equipment (Perkin Elmer)

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Differential scanning calorimeter DSC 204 F1 (Netzsch)

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Cryostat with superconducting magnet (Cryogenics)

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Vibrating Sample Magnetometer-VSM (Cryogenics)

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Magnetic Circular Dichroism Spectrometer (Jasco)

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Broadband Dielectric Spectrometer (Novocontrol)

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Surface Area and Porosimetry Analyzer ASAP 2020 (Micromeritics)

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Thermal Constant Analyzer (Netzsch)

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Complex system for electrical characterization

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Set-up for electrical, photoelectrical, Hall effect and
magnetoresistance characterizations of semiconductor
nanostructured materials

See Description