Structural Characterization

Analytical Atomic Resolution Electron Microscope JEM-ARM200F
(JEOL)

See Description

Scanning electron microscope Evo 50 XVP with EDAX attachment
(Carl Zeiss NTS )

See Description

Atomic Force Microscope AFM/PFM MFP-3D-SA (Asylum Research)

See Description

X-ray Diffractometer, D8 ADVANCE type (BRUKER-AXS)

See Description

Mossbauer Spectrometer with magnetic field, ultralow
temperature cryostat (Engelmann Scientific)

See Description

Pulsed Fourier-transform Electron Spin Resonance
Spectrometer (Bruker)

See Description

X-ray absorption fine structure spectrometer (Rigaku)

See Description